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[[Image:NEOWEB11.png|thumb|420px|NeoScan field probe scanning the surface of a microstrip patch antenna at 2.4GHz349GHz.]]
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For instance, you can examine the inter-element coupling effects in passive and active phased arrays. The figure below shows a 64-element fixed-beam X-band patch antenna array with an elaborate micostrip corporate feed network operating at 10.65GHz. The array was designed with a uniform amplitude distribution, <i>i.e.</i>, it should supply equal powers to all the 64 patch radiators.
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You can use [[NeoScan]] for measurement of different types of antenna structures and array topologies. In certain cases, prior physical knowledge of field distributions may facilitate and expedite the scanning process. For example, the figure below shows an X-band slotted waveguide array operating at 9.4GHz42GHz. From the physics of such structures, you know that the fields are highly localized close to the centerline of the waveguide array. In addition, the tangential field component parallel to the direction of the slots is zero. Therefore, if the goal of near-field scanning is to compute the far-field radiation patterns, only one tangential field component needs to be mapped. For a complete near-field characterization, however, you may want to measure the normal field maps, too.
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[[Image:NEOWEB15.png|thumb|left|550px|Measuring the fields at the aperture of an X-band slotted waveguide antenna array at 9.4GHz42GHz.]]
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