NeoScan for Antenna Characterization - Revision history

Asabet at 20:30, 19 October 2016

2016-10-19T20:30:32Z

Asabet at 20:12, 19 October 2016

2016-10-19T20:12:43Z

Asabet at 20:04, 19 October 2016

2016-10-19T20:04:06Z

Asabet at 21:30, 3 October 2016

2016-10-03T21:30:48Z

Kazem Sabet: /* A Perfect Solution for Characterizing High-Power Antenna Systems */

2016-10-03T00:07:06Z

‎A Perfect Solution for Characterizing High-Power Antenna Systems

Kazem Sabet: /* One System for Both Near & Far Field Characterization */

2016-10-03T00:06:51Z

‎One System for Both Near & Far Field Characterization

Kazem Sabet: /* NeoScan vs. Conventional Near-Field Scanning Systems */

2016-10-03T00:06:33Z

‎NeoScan vs. Conventional Near-Field Scanning Systems

Kazem Sabet at 21:41, 2 October 2016

2016-10-02T21:41:00Z

Kazem Sabet at 21:21, 2 October 2016

2016-10-02T21:21:21Z

Kazem Sabet: /* A Perfect Solution for Characterizing High-Power Antenna Systems */

2016-10-02T16:07:16Z

‎A Perfect Solution for Characterizing High-Power Antenna Systems

@@ Line 178: / Line 178: @@
 </table>
-You can use [[NeoScan]] for measurement of different types of antenna structures and array topologies. In certain cases, prior physical knowledge of field distributions may facilitate and expedite the scanning process. For example, the figure below shows an X-band slotted waveguide array operating at 9.4GHz. From the physics of such structures, you know that the fields are highly localized close to the centerline of the waveguide array. In addition, the tangential field component parallel to the direction of the slots is zero. Therefore, if the goal of near-field scanning is to compute the far-field radiation patterns, only one tangential field component needs to be mapped. For a complete near-field characterization, however, you may want to measure the normal field maps, too.
+You can use [[NeoScan]] for measurement of different types of antenna structures and array topologies. In certain cases, prior physical knowledge of field distributions may facilitate and expedite the scanning process. For example, the figure below shows an X-band slotted waveguide array operating at 9.42GHz. From the physics of such structures, you know that the fields are highly localized close to the centerline of the waveguide array. In addition, the tangential field component parallel to the direction of the slots is zero. Therefore, if the goal of near-field scanning is to compute the far-field radiation patterns, only one tangential field component needs to be mapped. For a complete near-field characterization, however, you may want to measure the normal field maps, too.
 <table>
 <tr>
 <td>
-[[Image:NEOWEB15.png|thumb|left|550px|Measuring the fields at the aperture of an X-band slotted waveguide antenna array at 9.4GHz.]]
+[[Image:NEOWEB15.png|thumb|left|550px|Measuring the fields at the aperture of an X-band slotted waveguide antenna array at 9.42GHz.]]
 </td>
 </tr>

← Older revision		Revision as of 20:12, 19 October 2016
Line 109:		Line 109:
	</table>		</table>

−	For instance, you can examine the inter-element coupling effects in passive and active phased arrays. The figure below shows a 64-element fixed-beam X-band patch antenna array with an elaborate micostrip corporate feed network operating at 10.65GHz. The array was designed with a uniform amplitude distribution, i.e., it should supply equal powers to all the 64 patch radiators.	+	For instance, you can examine the inter-element coupling effects in passive and active phased arrays. The figure below shows a 64-element fixed-beam X-band patch antenna array with an elaborate micostrip corporate feed network operating at 10.65GHz. The array was designed with a uniform amplitude distribution, <i>i.e.</i>, it should supply equal powers to all the 64 patch radiators.

@@ Line 14: / Line 14: @@
 <tr>
 <td>
-[[Image:NEOWEB11.png|thumb|420px|NeoScan field probe scanning the surface of a microstrip patch antenna at 2.4GHz.]]
+[[Image:NEOWEB11.png|thumb|420px|NeoScan field probe scanning the surface of a microstrip patch antenna at 2.349GHz.]]
 </td>
 </tr>

@@ Line 1: / Line 1: @@
 [[File:NeoScan_Product.png|thumb|400px]]
+__NOTOC__
 [[Image:Back_icon.png|40px]] '''[[NeoScan| Back to NeoScan Main Page]]'''

@@ Line 173: / Line 173: @@
 <tr>
 <td>
-{{#ev:youtube|https://www.youtube.com/watch?v=oAa-XqE9H1g|480|left|<b>VIDEO</b>: Characterizing an X-band slotted waveguide array.| frame}}
+{{#ev:youtube|https://www.youtube.com/watch?v=oAa-XqE9H1g|550|left|<b>VIDEO</b>: Characterizing an X-band slotted waveguide array.| frame}}
 </td>
 </tr>

@@ Line 104: / Line 104: @@
 <tr>
 <td>
-{{#ev:youtube|https://www.youtube.com/watch?v=l5KjauYge5o|480|left|<b>VIDEO</b>: Mapping the near-fields of a 64-element X-band patch antenna array with a corporate feed network.|frame}}
+{{#ev:youtube|https://www.youtube.com/watch?v=l5KjauYge5o|550|left|<b>VIDEO</b>: Mapping the near-fields of a 64-element X-band patch antenna array with a corporate feed network.|frame}}
 </td>
 </tr>

@@ Line 40: / Line 40: @@
 <tr>
 <td>
-{{#ev:youtube|https://www.youtube.com/watch?v=sjG2aua-4mk|480|left|'''VIDEO''': Characterizing an S-band microstrip-fed patch antenna using NeoScan.|frame}}
+{{#ev:youtube|https://www.youtube.com/watch?v=sjG2aua-4mk|550|left|'''VIDEO''': Characterizing an S-band microstrip-fed patch antenna using NeoScan.|frame}}
 </td>
 </tr>

← Older revision		Revision as of 21:41, 2 October 2016
Line 1:		Line 1:
	[[File:NeoScan_Product.png\|thumb\|400px]]		[[File:NeoScan_Product.png\|thumb\|400px]]
		+
		+	[[Image:Back_icon.png\|40px]] '''[[NeoScan\| Back to NeoScan Main Page]]'''
		+
	== From Near Fields to Far Fields ==		== From Near Fields to Far Fields ==

← Older revision		Revision as of 21:21, 2 October 2016
Line 1:		Line 1:
		+	[[File:NeoScan_Product.png\|thumb\|400px]]
	== From Near Fields to Far Fields ==		== From Near Fields to Far Fields ==

← Older revision		Revision as of 16:07, 2 October 2016
Line 164:		Line 164:

	EMAG's unique probe and optical processing technology utilizing polarization maintaining (PM) optical fibers allows standoff distances as long as 50 meters between the probe location at the aperture of the high-power array and the optical mainframe. This enables you to readily characterize very high-power antenna systems very accurately in a totally non-invasive manner without any serious safety or logistic concerns. In other words, you don't need to attenuate or lower the transmitted power levels of your antenna system to meet safety requirements or make it possible for the conventional metallic probes to operate in the proximity of the antenna aperture without interfering with it. With [[NeoScan]], you can characterize your high-power antennas or active phased arrays under their true or nominal operating conditions.		EMAG's unique probe and optical processing technology utilizing polarization maintaining (PM) optical fibers allows standoff distances as long as 50 meters between the probe location at the aperture of the high-power array and the optical mainframe. This enables you to readily characterize very high-power antenna systems very accurately in a totally non-invasive manner without any serious safety or logistic concerns. In other words, you don't need to attenuate or lower the transmitted power levels of your antenna system to meet safety requirements or make it possible for the conventional metallic probes to operate in the proximity of the antenna aperture without interfering with it. With [[NeoScan]], you can characterize your high-power antennas or active phased arrays under their true or nominal operating conditions.
		+

	<table>		<table>