NeoScan Showcased in IEEE IMS 2017 Session
EMAG Technologies Inc. submitted a paper titled “Characterization and Diagnostics of Active Phased Array Modules Using Non-Invasive Electro-Optic Field Probes with a CW Laser Source” to the 2017 IEEE international Microwave Symposium (IMS). This year the IMS was held in Honolulu, HI, from June 5th to June 9th, 2017. The paper was presented by Dr. Sabet in the Thursday morning session TH2I titled “Active Array Systems and Beam Formers”. The diagnostic application of the NeoScan system for active phased array systems was particularly underlined in this conference paper.
Abstract: Electro-optic (EO) field probes can be used very effectively for simultaneous near-field and far-field characterization of radiating apertures. Due to their very small footprint and absence of any metallic parts at the signal pickup area, EO probes provide a non-invasive method for ultra-wideband measurement of aperture-level fields in RF circuits and antennas with very high spatial resolution. In this paper, we describe the use of EO field probes with a CW laser source to characterize a vertically integrated X-band active phased array tile and verify the measured results with simulation data and anechoic chamber measurements.