Changes

Analyzing Circuits Using Predefined Tests

84 bytes removed, 21:08, 10 November 2016
/* DC Sweep Test */
<table>
<tr>
<td> [[File:b2MAN_Fig47.png|thumb|left|250px|DC Sweep Test Settings.]]
</td>
<td> [[File:b2MAN_Fig50.png|thumb|left|250px|DC Sensitivity Test Settings.]]</td></tr>
</table>
 
===Generating Characteristic v-i Curves for Active Devices===
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