== One System for Both Near & Far Field Characterization ==
{{#ev:youtube|https://www.youtube.com/watch?v=l5KjauYge5o|500|right|<b>VIDEO</b>: Mapping the near-fields of a 64-element X-band patch antenna array with a corporate feed network.|frame}}
In short, with [[NeoScan]], you get a compact portable self-contained system that characterizes your antenna system from the very near fields to the very far fields without requiring considerable real estate.
== The Perfect Solution for Characterizing High-Power Antenna Systems ==
{{#ev:youtube|https://www.youtube.com/watch?v=oAa-XqE9H1g|400|right|<b>VIDEO</b>: Characterizing an X-band slotted waveguide array.| frame}}
Characterization of high-power active phased arrays is a very challenging task. Special considerations must be taken into account when measuring high-power antenna systems in an anechoic chamber including operator's safety. [[NeoScan]] probes can handle field intensities as large as 2MV/m and can even withstand higher radiated power levels. EMAG's unique probe and optical processing technology allows standoff distances as long as 50 meters between the probe location at the aperture of the high-power array and the optical mainframe and processing unit. This enables you to readily characterize very high-power antenna systems very accurately in a totally non-invasive manner without any serious safety or logistic concerns.