== Introducing NeoScan ==
EMAG Technologies Inc. offers unique, versatile solutions for your RF test and characterization needs. The [[NeoScan]] family of turnkey field measurement systems provide provides a non-invasive method to detect and probe the electric and magnetic fields generated by your RF devices, antennas or subsystems. They utilize our patented electro-optic and magneto-optic probe technologies to sample and measure electric and magnetic fields without any physical contact, while providing a very large operational bandwidth and a very high spatial resolution.
Unlike conventional near-field scanning systems that require metallic pickup radiators or sensors, [[NeoScan]] probes are made of absolutely metal-free parts. Our field probes feature miniaturized optical crystal tips mounted on optical fibers. The combination of extremely small probe footprint and absence of metallic parts or interconnnects at the signal pickup area warrant the ultimate RF non-invasiveness. In addition to local field sampling, a [[NeoScan]] system can be configured as a near-field scanning system for mapping aperture-level or device-level field distributions with minimal invasiveness to the antenna or device under test. You can also use a [[NeoScan]] system as a real-time field detection system for sensing and probing electric and magnetic field waveforms in a variety of physical propagation media.