Changes

Analyzing Circuits Using Predefined Tests

33 bytes removed, 16:37, 1 December 2015
/* Generating Characteristic v-i Curves for Active Devices */
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You can readily open any of these projects by going to the [[Schematic Editor]]'s File Menu and choosing Open > Open Curve Tracer Test Circuit... The standard [[Windows]] Open dialog opens up in the "[[Tests]] Folder", and you can select and open any of the above eleven test circuits. By default, each test circuit uses a generic active device type. You can easily replace the default generic type with any other model from any manufacturer. Simply select the active device part, go to [[Schematic Editor]]'s Edit Menu and choose "Edit Part, Device or Model > Select Alternate Model..." This opens up the "Select Model Dialog", where you can search for your new device to the replace the default one.
The supplied test projects already come with all the right test [[parameters]]. All you have to do is to press the Run button to run the sweep and generate the characteristic curves. For example, in the case of a BJT, the DC sweep test runs a double sweep of collector-emitter voltage (vce) and the base current (ib). In the test setup panel, the "Source" and "Property" are set to "vce" and "dc", respectively. The value of the base current is another sweep variable set from the Sweep Settings dialog. For more information about sweep [[tests]], please refer to the section on "[[b2_sweep | Parametric Sweeps and Monte Carlo Tests]]". The figures below show the NPN-type BJT curve tracer test circuit and the graph of its v-i characteristic curves.
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