Changes

[[Image:NEOWEB4.png|thumb|700px600px|The NeoScan turnkey field measurement system.]]<strong><font color="#07417e707983" size="4">NON-INVASIVE TURNKEY FIELD MEASUREMENT SYSTEM ''CAPTURE THE INVISIBLE''</font></strong>

[[Image:Back_icon.png|40px]] '''Welcome to [[Main_Page | Back to Emagtech Wiki GatewayNeoScan]]Wiki!'''

===<table><tr><td>[[image:NeoScan-ico.png | link=NeoScan Product Overview]]</td><td><strong><font color="#707983" size="3">&nbsp; INTRODUCING THE FIRST</font></strong> <br /><strong><font color="#07417e" size="4">&nbsp; NON-INVASIVE, HIGH-RESOLUTION, ULTRA-WIDEBAND </font></strong> <br /><strong><font color="#07417e" size="4">&nbsp; TURNKEY FIELD MEASUREMENT SYSTEM </font></strong></td></tr></table>

===* [[NoeScan: Product Overview]]* [[NeoScan System Applications]] * [[NeoScan Probe Technology]]===* [[Non-Invasive Near-Field Scanning Using NeoScan]]* [[NeoScan for Antenna Characterization]]* [[NeoScan for Real-Time Waveform Probing]]* [[NeoScan Video Gallery]]

[[image:Cube-icon.png | link== Product Overview == EM.Cube]] &nbsp; '''[[EM.Cube | Visit EM.Cube Wiki Site]]'''

EMAG Technologies Inc[[image:RFSpice-ico. offers the NeoScan family of turnkey field measurement systemspng | link=RF. NeoScan systems utilize our unique, patented, electro-optic and magneto-optic probe technologies to detect, sample, measure and scan electric and magnetic fields in a non-invasive manner, while providing a very large operational bandwidth and a very high spatial resolutionSpice A/D]] &nbsp; '''[[RF.Spice A/D | Visit RF. Spice A/D Wiki Site]]'''

The basic NeoScan system uses a non-invasive optical fiber probe to sample the ambient field penetrating the probe's head. The optical beam from a laser source passes through an optical crystal at the probe head, and its polarization state is modulated by the high frequency electric or magnetic field. The reflected optical beam is then demodulated by an optical processing system and measures the modulating electric or magnetic field signal. In addition to basic field measurement at a fixed point in space, NeoScan can also be configured as a near-field scanning system for mapping aperture-level or device-level field distributions with minimal invasiveness to the antenna or device under test. Or it can be used as a real-time field detection system for sensing and detecting electric and magnetic fields in a variety of physical propagation media. Unlike conventional near-field scanning systems that utilize metallic radiators to pick up the fields, NeoScan probes are made up of absolutely non-metallic parts. Our field probes feature extremely small optical crystals mounted at the tip of an optical fiber. The combination of small probe size and absence of metallic parts thus leads to the ultimate RF non-invasiveness. NeoScan systems can be used for a variety of RF test and evaluation applications: <ul> <li> Non-invasive near-field mapping of RF devices, circuits and antennas</li> <li> System fault diagnostics through measurement of field emissions, leakage, coupling effects, etc.</li> <li> Compact near-field antenna range measurements</li> <li> Real time non-contact measurement of fields and signals in a variety of propagation media</li></ul>  == A Unique Test & Evaluation Capability == [[Image:NEOWEB17Back_icon.png|thumb40px]] '''[[Main_Page |450px|Measuring the aperture fields of a 16GHz standard horn antenna using NeoScan.Back to Emagtech Wiki Gateway]]Some of the key features of NeoScan field measurement systems include: *Non-intrusive and non-contact RF measurement thanks to the small probe footprint and absence of any metal parts or interconnnects at the signal pickup area*Broad measurement bandwidth (20MHz - 20GHz) using the same optical probes*Simultaneous amplitude and phase measurement*Vectorial component measurement with cross polarization suppression better than 20dB*Very wide dynamic range (>70dB) from very low field intensities under 1V/m to extremely high field intensities above 2MV/m using the same optical probes*Typical probe tip size: 1mm³*High spatial resolution driven by the laser beam spot size (finer than 10 μm in diameter) with scan steps as small as 100&mu;m *DUT proximity: As close as 150&mu;m *Standoff distance (of mainframe box): Up to 50m == Applications of the NeoScan System == The following are a few examples of how you can use the NeoScan system to measure electric fields in a variety of applications:  *High-Resolution Near-Field Scanning *RF Test & Characterization*Compact Antenna Range Alternative*RF Circuit & Device Diagnostics*Phase Calibration of AESA Arrays*Real-time Field Detection*EMC/EMI Testing & Certification*Ultra-wideband Pulse Waveform Probing*High-Power Microwave System Evaluation*Field Monitoring in Medical Devices and Biological Environments*Non-Contact, Non-Invasive, Remote Field Sensing & Evaluation*Model Verification & Validation (V&V)'''