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EMAG Technologies Inc. offers the a unique and innovative solution for your RF test and characterization needs. The NeoScan family of turnkey field measurement systemsprovide a non-invasive method to detect and probe the electric and magnetic fields generated by your RF devices, antennas or subsystems. NeoScan systems They utilize our unique, patented, electro-optic and magneto-optic probe technologies to detect, sample, measure and scan measure electric and magnetic fields in a non-invasive mannerwithout physical contact, while providing a very large operational bandwidth and a very high spatial resolution.

The basic Unlike conventional near-field scanning systems that utilize metallic radiators to pick up the fields, NeoScan system uses a probes are made up of absolutely non-invasive metallic parts. Our field probes feature extremely small optical fiber probe to sample crystals mounted at the ambient field penetrating the probe's head. The optical beam from a laser source passes through tip of an optical crystal at the probe head, and its polarization state is modulated by the high frequency electric or magnetic fieldfiber. The reflected optical beam is then demodulated by an optical processing system combination of small probe size and measures absence of metallic parts thus leads to the modulating electric or magnetic field signalultimate RF non-invasiveness. In addition to basic field measurement at a fixed -point in spacefield sampling, NeoScan systems can also be configured as a near-field scanning system for mapping aperture-level or device-level field distributions with minimal invasiveness to the antenna or device under test. Or it they can be used as a real-time field detection system for sensing and detecting electric and magnetic fields in a variety of physical propagation media.

Unlike conventional near-field scanning systems that utilize metallic radiators to pick up the fields, NeoScan probes are made up of absolutely non-metallic parts. Our field probes feature extremely small optical crystals mounted at the tip of an optical fiber. The combination of small probe size and absence of metallic parts thus leads to the ultimate RF non-invasiveness. NeoScan systems can be used for a variety of RF test and evaluation applications: