Changes

Analyzing Circuits Using Predefined Tests

28 bytes added, 20:59, 19 August 2015
/* Generating Characteristic v-i Curves for Active Devices */
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[[File:b2MAN_Fig224.png|thumb|350px420px|The NPN-Type BJT curve tracer test circuit.]]
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[[File:b2MAN_Fig225.png|thumb|500px640px|The generated characteristic v-i curves for the generic NPN-Type BJT.]]
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