== An Overview of RF.Spice A/D Tests ==
[[File:b2MAN_Fig5.png|thumb|160px200px|B2RF.Spice A/D Test Panel.]]
This section describes the details of the various test types available in [[B2.Spice A/D]]. You can specify one or more [[tests]] to be performed at the same time. This is done using the checkboxes available for each test type in the "Test Panel" of the Toolbox. Most [[tests]] offer three options: Basic, Sweep and Monte Carlo (M.C.). The "Basic" test is a single-run simulation, while in a "Sweep" you vary the value of a device parameter. The "Monte Carlo" simulation provides an opportunity to examine the statistical behavior of your circuit given the tolerances for some part values.